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Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

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Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

Name: Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device
Brand: Lonroy
Price: 1 USD

Brand Name : Lonroy

Model Number : LR-A086

Certification : ISO ASTM CE

Place of Origin : China

MOQ : 1

Price : Negotaible

Payment Terms : L/C,D/A,D/P,T/T,Western Union

Supply Ability : 200

Delivery Time : 5-8 work days

Packaging Details : Wooden package

Maximum Measuring Speed : 2 mm/s

Marble Dimensions : 500 mm × 800 mm

Z1 Linear Accuracy : ≤±(0.5 +|0.02H|) μm

Warranty : 1 Year

X-axis Driving Mode : Electric

Y-axis Driving Mode : Electric

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Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

Description

The surface topography measurement instrument is a measurement device specifically designed for the microscopic morphology analysis of high-precision parts, featuring high-precision measurement capabilities and excellent stability.

In the field of precision manufacturing, the traditional measurement method of just one dimension is no longer sufficient to meet the stringent quality requirements of modern industries for parts. Although conventional size detection can reflect the geometric tolerances of parts, it is difficult to capture the key influence of the surface micro-topography on the performance of the parts.

The topography measurement instrument breaks through the limitations of traditional measurement methods and is specifically designed for the microscopic morphology analysis of high-precision parts. It adopts advanced contact sensor technology to accurately measure surface features ranging from nanometers to micrometers.

Technical Parameters

Measuring Range	X-axis	120-220 mm
	X-axis Resolution	1.2 nm
	Z-axis	420 mm, 620 mm (optional)
Profile Sensor	Z1-axis Measuring Range	30-60 mm
	Z1 Resolution	1.2 nm
Profile Accuracy	Z1 Linear Accuracy	≤±(0.5 +\|0.02H\|) μm
	Circular Arc	±(1 + R/12) μm
	Circular Arc Pt	≤0.3 μm
	Angle	±1′
	Straightness	0.3 μm/100 mm (cut-off wavelength 0.8)
Driving Speed	X-axis Driving Mode	Electric
	Y-axis Driving Mode	Electric
Maximum Measuring Speed		2 mm/s
Marble Dimensions		500 mm × 800 mm
Countertop Material		Natural marble

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